Filtry
Filtry
Logika specjalistyczna
| Obraz | część # | Opis | producent | Akcje | RFQ | |
|---|---|---|---|---|---|---|
![jakość [#varpname#] fabryka](/images/load_icon.gif){kind=icon}
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SN74ABT8996PWR |
ADRESOWALNY PORT SKANOWANIA IC 24TSSOP
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Texas Instruments
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SSTVF16857ALLF |
REJESTR IC DDR 48-TVSOP
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Renesas Electronics America Inc.
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SN74LV161284DL |
IC 19-BITOWY INTERFEJS BUS 48-SSOP
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Texas Instruments
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SN74SSTUB32866ZKER |
KONFIG. IC REG BUFF 25BIT 96-BGA
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Texas Instruments
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SN74BCT8373ANT |
ZATRZASK URZĄDZENIA TESTOWEGO SKANOWANIA IC 24-DIP
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Texas Instruments
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SY10EL16VAZC |
IC RCVR DIFF 5V/3,3V 8-SOIC
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Technologia mikroczipów
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MC14007UBCPG |
INWERTER IC DUAL COMP 14DIP
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pół
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NBSG16MNHTBG |
TRANSCEIVER IC 16QFN
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pół
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SY100EL16VZG-TR |
IC RCVR DIFF 5V/3,3V 8-SOIC
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Technologia mikroczipów
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SN74ABT8996PW |
ADRESOWALNY PORT SKANOWANIA IC 24TSSOP
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Texas Instruments
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NB100LVEP17DTR2 |
IC DRV/RCV ECL QUAD DIFF 20TSSOP
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pół
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CD4527BEG4 |
MNOŻNIK STAWKI IC BCD 16-DIP
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Texas Instruments
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SSTU32865ET/G,551 |
BUFOR REG IC 28BIT 160-TFBGA
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NXP USA Inc.
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74GTLP22034DGVRG4 |
IC LVTTL/GTLP ADJ TXRX 48TVSOP
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Texas Instruments
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SY10EL16VDZG |
IC RCVR DIFF 3,3/5 V 16-SOIC
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Technologia mikroczipów
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MC100EP16VSDG |
IC RCVR/DRVR ECL RÓŻNICA VAR 8SOIC
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pół
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SY10EL16VFZI |
IC RCVR DIFF 5V/3,3V 8-SOIC
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Technologia mikroczipów
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MC10H115P |
ODBIORNIK IC QUAD LINE ECL 16DIP
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pół
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SN74ABT8245DW |
TEST SKANOWANIA IC DEV/TXRX 24-SOIC
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Texas Instruments
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SN74ABT18640DL |
IC SCAN-TEST-DEV/TXRX 56-SSOP
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Texas Instruments
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MC100EP16VTDTR2 |
IC RCVR/DRVR ECL RÓŻNICA VAR 8TSSOP
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pół
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SN74LVT8996DW |
10-BITOWY PORT SKANOWANIA IC XCVR 24-SOIC
|
Texas Instruments
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74ACT1284MTCX |
ZGODNY Z TXRX IEEE TTL 20TSSOP
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pół
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STUM32868ET,518 |
KONFIGURACJA BUFORA IC REG 176TFBGA
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NXP USA Inc.
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SY100EL16VDKI-TR |
IC RCVR DIFF 5 V/3,3 V 10-MSOP
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Technologia mikroczipów
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NBSG16BA |
TRANSCEIVER IC 16FCBGA
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pół
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CD40117BM96G4 |
IC TERMINATOR PROG DUAL 14-SOIC
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Texas Instruments
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MC100EP16VADR2 |
IC RCVR/DRVR 5V RÓŻNICA ECL 8-SOIC
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pół
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SSTUH32865ET,557 |
IC BUFFER 1.8V 28BIT SOT802
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NXP USA Inc.
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SN74ABT8952DL |
IC SCAN-TEST-DEV/XCVR 28-SSOP
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Texas Instruments
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MC100EL16DTR2G |
IC RCVR ECL RÓŻNY 5V 8TSSOP
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pół
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SSTUAF32866BHLFT |
BUFF REJESTRU IC 25BIT DDR2 96-BGA
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Renesas Electronics America Inc.
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IDT74SSTU32864DBFG8 |
BUFOR IC 1:1/1:2 96-LFBGA
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Renesas Electronics America Inc.
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SY10EL16VAZI-TR |
IC RCVR DIFF 5V/3,3V 8-SOIC
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Technologia mikroczipów
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MC14007UBDR2 |
IC INVERTER DUAL COMP 14SOIC
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pół
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MC100EL16DG |
IC RCVR ECL RÓŻNY 5V 8SOIC
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pół
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CD4007UBPW |
IC PODWÓJNA PARA KOMPLEKSOWA Z/INV 14TSSOP
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Texas Instruments
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SY10E416JI-TR |
IC LINE RCVR QUINT DIFF 28-PLCC
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Technologia mikroczipów
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SY10EL16VBKG |
IC RCVR DIFF 3,3/5 V 8-MSOP
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Technologia mikroczipów
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SY10EL16VKC |
IC RCVR DIFF 5 V/3,3 V 8-MSOP
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Technologia mikroczipów
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NB4N855SMR4G |
IC DRVR/RCVR/BUFF/XLATOR MICRO10
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pół
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CD4007UBNSRG4 |
IC DUAL COMPL PAIR W/INV 14SO
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Texas Instruments
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SY10E212JZ |
SKANOWANIE 3BITOWEGO REJESTRU IC 28-PLCC
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Technologia mikroczipów
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MC100EP16VBDR2G |
IC RCVR/DRVR 5V RÓŻNICA ECL 8-SOIC
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pół
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MC100EP16VTDTR2G |
IC RCVR/DRVR ECL RÓŻNICA VAR 8TSSOP
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pół
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Wymagania dotyczące: |
ZATRZASK URZĄDZENIA TESTOWEGO SKANOWANIA IC 24SOIC
|
Texas Instruments
|
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SN74LVT8986PM |
ADRES ŁĄCZA IC SCAN-PORT 64-LQFP
|
Texas Instruments
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SY100EL16VDZC TR |
IC RCVR DIFF 5 V/3,3 V 16-SOIC
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Technologia mikroczipów
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100POZIOM16M |
ODBIORNIK IC 3,3 V ECL DIFF 8SOIC
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pół
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MC100EP16VAD |
IC RCVR/DRVR ECL DIFF 5V 8SOIC
|
pół
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