Filtry
Filtry
Logika
| Obraz | część # | Opis | producent | Akcje | RFQ | |
|---|---|---|---|---|---|---|
![jakość [#varpname#] fabryka](/images/load_icon.gif){kind=icon}
|
74ACT1284MTCX |
ZGODNY Z TXRX IEEE TTL 20TSSOP
|
pół
|
|
|
|
|
|
STUM32868ET,518 |
KONFIGURACJA BUFORA IC REG 176TFBGA
|
NXP USA Inc.
|
|
|
|
|
|
SY100EL16VDKI-TR |
IC RCVR DIFF 5 V/3,3 V 10-MSOP
|
Technologia mikroczipów
|
|
|
|
|
|
NBSG16BA |
TRANSCEIVER IC 16FCBGA
|
pół
|
|
|
|
|
|
CD40117BM96G4 |
IC TERMINATOR PROG DUAL 14-SOIC
|
Texas Instruments
|
|
|
|
|
|
MC100EP16VADR2 |
IC RCVR/DRVR 5V RÓŻNICA ECL 8-SOIC
|
pół
|
|
|
|
|
|
SSTUH32865ET,557 |
IC BUFFER 1.8V 28BIT SOT802
|
NXP USA Inc.
|
|
|
|
|
|
SN74ABT8952DL |
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Texas Instruments
|
|
|
|
|
|
MC100EL16DTR2G |
IC RCVR ECL RÓŻNY 5V 8TSSOP
|
pół
|
|
|
|
|
|
SSTUAF32866BHLFT |
BUFF REJESTRU IC 25BIT DDR2 96-BGA
|
Renesas Electronics America Inc.
|
|
|
|
|
|
IDT74SSTU32864DBFG8 |
BUFOR IC 1:1/1:2 96-LFBGA
|
Renesas Electronics America Inc.
|
|
|
|
|
|
SY10EL16VAZI-TR |
IC RCVR DIFF 5V/3,3V 8-SOIC
|
Technologia mikroczipów
|
|
|
|
|
|
MC14007UBDR2 |
IC INVERTER DUAL COMP 14SOIC
|
pół
|
|
|
|
|
|
MC100EL16DG |
IC RCVR ECL RÓŻNY 5V 8SOIC
|
pół
|
|
|
|
|
|
CD4007UBPW |
IC PODWÓJNA PARA KOMPLEKSOWA Z/INV 14TSSOP
|
Texas Instruments
|
|
|
|
|
|
SY10E416JI-TR |
IC LINE RCVR QUINT DIFF 28-PLCC
|
Technologia mikroczipów
|
|
|
|
|
|
SY10EL16VBKG |
IC RCVR DIFF 3,3/5 V 8-MSOP
|
Technologia mikroczipów
|
|
|
|
|
|
SY10EL16VKC |
IC RCVR DIFF 5 V/3,3 V 8-MSOP
|
Technologia mikroczipów
|
|
|
|
|
|
NB4N855SMR4G |
IC DRVR/RCVR/BUFF/XLATOR MICRO10
|
pół
|
|
|
|
|
|
CD4007UBNSRG4 |
IC DUAL COMPL PAIR W/INV 14SO
|
Texas Instruments
|
|
|
|
|
|
SY10E212JZ |
SKANOWANIE 3BITOWEGO REJESTRU IC 28-PLCC
|
Technologia mikroczipów
|
|
|
|
|
|
MC100EP16VBDR2G |
IC RCVR/DRVR 5V RÓŻNICA ECL 8-SOIC
|
pół
|
|
|
|
|
|
MC100EP16VTDTR2G |
IC RCVR/DRVR ECL RÓŻNICA VAR 8TSSOP
|
pół
|
|
|
|
|
|
Wymagania dotyczące: |
ZATRZASK URZĄDZENIA TESTOWEGO SKANOWANIA IC 24SOIC
|
Texas Instruments
|
|
|
|
|
|
SN74LVT8986PM |
ADRES ŁĄCZA IC SCAN-PORT 64-LQFP
|
Texas Instruments
|
|
|
|
|
|
SY100EL16VDZC TR |
IC RCVR DIFF 5 V/3,3 V 16-SOIC
|
Technologia mikroczipów
|
|
|
|
|
|
100POZIOM16M |
ODBIORNIK IC 3,3 V ECL DIFF 8SOIC
|
pół
|
|
|
|
|
|
MC100EP16VAD |
IC RCVR/DRVR ECL DIFF 5V 8SOIC
|
pół
|
|
|
|
|
|
MC100LVEP16DR2G |
ODBIORNIK IC/DRVR DIFF ECL 8-SOIC
|
pół
|
|
|
|
|
|
SY100S314JZ |
IC LINE RCVR QUINT DIFF 28-PLCC
|
Technologia mikroczipów
|
|
|
|
|
|
Wymagania dotyczące: |
URZĄDZENIE TESTOWE SKANOWANIA IC BUFF 24-SOIC
|
Texas Instruments
|
|
|
|
|
|
MC100EP16VBDT |
IC RCVR/DRVR ECL DIFF 5V 8TSSOP
|
pół
|
|
|
|
|
|
SY100S314FC |
IC LINE RCVR QUINT DIFF 24CERPAK
|
Technologia mikroczipów
|
|
|
|
|
|
MC14008BCPG |
IC PEŁNY DODATK 4BIT P/N 16-DIP
|
pół
|
|
|
|
|
|
SN74GTLP22033DGVR |
IC REG TXRX LVTTL-GTLP 48-TVSOP
|
Texas Instruments
|
|
|
|
|
|
SN74LVCE161284DLR |
IC IEEE STD 1284 TXRX 48-SSOP
|
Texas Instruments
|
|
|
|
|
|
SN74ABT8646DW |
IC SCAN-TEST-DEV/XCVR 28-SOIC
|
Texas Instruments
|
|
|
|
|
|
SSTVF16857DGG,512 |
STEROWNIK IC REG 14BIT SSTL 48TSSOP
|
NXP USA Inc.
|
|
|
|
|
|
SN74TVC16222ADLG4 |
IC 22-BITOWY ZACISK NAPIĘCIOWY 48-SSOP
|
Texas Instruments
|
|
|
|
|
|
CD4007UBEG4 |
IC DUAL COMPL PAIR W/INV 14-DIP
|
Texas Instruments
|
|
|
|
|
|
MC100EP16VCD |
IC RCVR/DRVR ECL DIFF 5V 8SOIC
|
pół
|
|
|
|
|
|
SY10EL16VCZG-TR |
IC RCVR DIFF 5V/3,3V 8SOIC
|
Technologia mikroczipów
|
|
|
|
|
|
SY100S336JC |
LICZNIK IC/REG.ZMIANY 28-PLCC
|
Technologia mikroczipów
|
|
|
|
|
|
74HC283N,652 |
IC 4BITOWY BINARNY PEŁNY DODATK 16-DIP
|
NXP USA Inc.
|
|
|
|
|
|
SN74ACT8997DW |
IC SCAN-PATH LINKER 28-SOIC
|
Texas Instruments
|
|
|
|
|
|
SSTUA32864BHLFT |
BUFOR REJESTRU IC 25BIT DDR 96BGA
|
Renesas Electronics America Inc.
|
|
|
|
|
|
MC14007UBD |
PODWÓJNA PARA IC COMP Z INV 14-SOIC
|
pół
|
|
|
|
|
|
74AUP1Z04GS,132 |
IC XTAL DRIVER LP 6XSON
|
Nexperia USA Inc.
|
|
|
|
|
|
SN74ACT1284PWG4 |
INTERFEJS IC BUS 20TSSOP
|
Texas Instruments
|
|
|
|
|
|
74LVX161284MEAX |
TXRX TŁUMACZENIE IEEE 48SSOP
|
pół
|
|
|